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Atomic Force Microscope for Research & Education.

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AFM holds a strong positions in scientific research as is used as a routine analytical tool for physical properties characterization with high spatial resolution down to atomic level. Solver Nano is the best choice for scientists who are need a single instrument that is an affordable, robust, user-friendly and professional tool.


Scientific research
Solver Nano – AFM for science.

Solver Nano is designed by the NT-MDT SI team that also created High Performance Systems like NTEGRA, NEXT II and NTEGRA Spectra II which have been proven in the scientific community through many key publications.

Solver Nano is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors. Capacitance sensors in comparison with strain gauge and optical sensors have lower noise and higher speed in the feedback signal. The CL scanner is controlled by a professional workstation and software.

These capabilities enable all of the basic AFM techniques in compact SPM design.

Because the SolverNano can be employed in diverse areas of research as AFM tool, several research examples are shown below:

  • Polymers
  • Bio objects
  • Carbon Materials


Atomic Force Microscopy

Contact AFM
Constant Height mode
Constant Force mode
Contact Error mode
Lateral Force Imaging
Spreading Resistance Imaging
Force Modulation microscopy
Piezoresponse Force Microscopy

Amplitude modulation AFM
Intermittent contact mode
Phase Imaging mode
Semicontact Error mode
Non-Contact mode
Electrostatic Force Modes
Contact EFM

Scanning Capacitance Microscopy
Kelvin Probe Force Microscopy

Dissipation Force Microscopy

AFM Spectroscopies
Force-distance curves
Adhesion Force imaging
Amplitude-distance curves
Phase-distance curves
Frequency-distance curves
Full-resonance Spectroscopy

STM techniques
Constant Current mode
Constant Height mode
Barrier Height imaging
Density of States imaging
I(z) Spectroscopy
I(V) Spectroscopy

AFM Oxidation Lithography
STM Lithography
AFM Lithography – Scratching
AFM Lithography – Dynamic Plowing

HD Modes

General specs:

Scanner 100 x 100 x 12 um closed loop scanner, 3x3x3 um open loop scanner
AFM resolution 0.01 nm
Environments Air and liquid measurements.
Combined video optical microscopes
Build in 100x optical USB microscope
External 500x optical microscope
Design Table-top, affordable, robust and user-friendly
Scanning field High voltage regime: 100x100x12 um
Low voltage regime: 3x3x3 um
Scanner type Metrological piezotube XYZ scanner with sensors
Sensors type XYZ – ultrafast capacitance sensors
Sensors noise Low noise XY sensor: < 0.3 nm
Metrological Z sensor: < 0.03 nm
Sensors linearity Metrological XY sensor: < 0.1%
Metrological Z sensor: < 0.1%
Overall scanner parameters 100x100x12 um with CL
Resolution: XY -0.3 nm, Z – 0.03 nm
Linearity: XY – < 0.1%, Z – < 0.1%
3x3x3 um with OL. Resolution: XY -0.05 nm,
Z – 0.01 nm
Sample positioning range 12 mm
Sample positioning resolution 1.5 um
Sample dimension up to 1,5” X 1,5” X 1/2”,   35x35x12 mm
Sample weight up to 100 g
Approach system type Z – Stepper Motor
Approach system step size 230 nm
Approach system speed rate 10 mm per min
Algorithm Gentle approach Available (probe guaranteed to stop before it touches the sample)
Scanning Heads
AFM head for Si cantilever Available. All commercial cantilevers can be used
Type of cantilever detection Laser/Detector Alignment
Probe holders Probe holder for air measurements. Probe holder for liquid measurements.
Type of AFM head mounting Cinematically mount. Mount accuracy 150 nm
(Remove/mount accuracy)
STM AFM head for wire probes Available. Tungsten wire for AFM measurement. (low cost experiments) Pt|Ir wire for STM measurements
Type of cantilever detection Piezo for AFM measurement
Probe holders Probe holder for air and liquid measurements
Controllers. Digital professional controller
Number of images can be acquired during one scanning cycle Up to 16
Image size Up to 8Kx8K scan size
ADC 500 kHz 16-bit ADC
12 channels (5 channels with software controlling gain amplifiers 1,10,100,1000)
Individual filter on each channel
DSP Floating point 320 MHz DSP
Digital FB Yes 6 Channels
DACs: 4 composite DACs (3x16bit) for X,Y,Z, Bias Voltage
2 16-bit DAC for user output
XYZ scanner control voltage High-voltage outputs: X, -X, Y, -Y, Z, -Z
at -150 V to +150 V
Low-voltage mode XY ± 10 V
XY RMS noise in 1000 Hz bandwidth 0.3 ppm RMS
Z RMS noise in 1000 Hz bandwidth 0.3 ppm RMS
XY bandwidth 4 kHz (LV regime – 10 kHz)
Z bandwidth 9 kHz
Maximal current of XY amplifiers 1.5 mA
Maximal current of Z amplifiers 8 mA
Integrated demodulator for X,Y,Z capacitive capacitance sensors Yes
Open/Closed-loop mode for X,Y controlх Yes
Generator frequency setting range DC – 5 MHz
Deflection registration channel bandwidth 170 Hz-5 MHz
Lateral Force registration channel bandwidth 170 Hz -5 MHz
2 additional registration channel bandwidth 170 Hz -5 MHz
Bias Voltage ± 10 V bandwidth 0 – 5 MHz
Modulating signals supply To the probe (external output);
High-voltage X,Y, Z channels
(including LV regime);
Bias Voltage
Number of generators for modulation, user accessible 2,  0-5 MHz, 0.1 Hz resolution
Stepper motor control outputs Two 16-bit DACs, 20 V peak-to-peak, max current 130 mA
Additional digital inputs/ outputs 6
Additional digital outputs 1
I2C bus Yes
Macro language
Max. cable length between the controller and SPM base or measuring heads 2 m
Computer interface USB 2.0
Voltage supply 110/220 V
Power consumption ≤ 110 W