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Multipurpose X-ray diffraction system.
The Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku’s patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can perform many different measurements…fast.
Engineered for Performance
With a multipurpose diffractometer, performance is measured by not only how fast you perform an experiment but also how fast you can switch between different types of experiments. Individual experiments are optimized with accessories like the D/teX Ultra high-speed position sensitive detector system, but the speed between experiments is radically improved with the combination of the automated alignment and CBO.
Designed for Flexibility
The Ultima IV is the only XRD system on the market today that incorporates fully automatic alignment. When coupled with CBO and the in-plane arm, the automatic alignment capability makes the Ultima IV X-ray diffractometer the most flexible system available for multipurpose applications.
In the Ultima IV XRD system, CBO technology eliminates time spent switching geometries, enables everyday users to run both sets of experiments without the need to reconfigure the system, and reduces wear and possible optic damage associated with the recurrent switching process. CBO and automatic alignment combine for the ultimate in functionality for: micro-crystalline diffraction, thin-film diffraction, small angle scattering, and in-plane scattering.
- Full automated alignment under computer control.
- Optional in-plane diffraction arm for in-plane measurements without reconfiguration.
- Focusing and parallel beam geometries without reconfiguration.
- SAXS capabilities.
- Optional D/teX Ultra high-speed, position-sensitive detector system.
Ultima IV specifications
|X-ray generator||Maximum rated output||3 kW|
|Rated tube voltage||20 – 60 kV|
|Rated tube current||2 – 60 mA|
|Target||Cu (others: optional)|
|Focus size||0.4 x 12 mm (others: optional)|
|Goniometer||Scanning mode||θs/θd coupled or θs, θd independent|
|Goniometer radius||285 mm|
|2θ measuring range||-3 to 162° (maximum)|
|Minimum step size||0.0001°|
|Optics||Divergence slit||Fixed or automatic variable|
|Scattering slit||Fixed or automatic variable|
|Receiving slit||Fixed or automatic variable|
|Optics alignment||Automatic alignment of tube height, goniometer, optics and detector|
|Monochromator||Dual position graphite diffracted beam monochromator for Cu (others: optional)|
|Detector||Detector||Scintillation counter (others: optional)|
|Dimensions||H x W x D||1600 x 1100 x 800 mm|
|Sample height||1050 mm|